Multifunctional scanning probe microscope (SPM) NT-206

Summary
Multifunctional scanning probe microscope (SPM) NT-206 is an atomic-force microscope complete with hardware and software required for nanometric resolution measuring and analysis of micro- and nano surface textures, micro and nano size range objects as well as their micromechanical and other properties.

Description
Multifunctional scanning probe microscope NT-206 consists of a measurement module and electronic control unit.[br][/br][br][/br]The measurement module includes a base platform and a sensing head mounted on it. It makes measurements on a moving sample (maximum probe sizes: Ø30 mm, height – 8 mm) under a stationary probe unit.[br][/br]The base platform is intended for sensing head mounting as well as for sample positioning and scanning. It includes a tubular piezoscanner to control XYZ-movement of the tested sample. It also contains an automatic forward/return motion system.[br][/br][br][/br]The XY-positioning platform ensures automatic XY-plane movement of the sensing head relative to the object table within 10х10 mm space (pitch is up to 2.5 μm, visual checking – up to 10 μm). Manual positioning is also possible.[br][/br][br][/br]The sensing head with its laser-beam probe console deviation detection scheme supports all operating modes (static and dynamic). It is intended for use with atomic-force probe units (Si, SiN) on 3,6x1,4x0,6 mm chips mounted in a removable holder.[br][/br][br][/br]A built-in video system facilitates probe monitoring and setting activities when a sample is positioned and viewed. The video system viewing field dimensions are 1x0,75 mm, visualization window dimensions – 640x480 pt, image frequency amounts to 30 images/s.[br][/br][br][/br]Depending on specific research tasks, the SPM NT-206 can be supplied with application-specific removable modules to carry out microtribometric and adhesive measurements as well as nano indentation.[br][/br]It is possible to use the SPM in research and industrial laboratories and introduce it into the higher educational establishments training activities.[br][/br][br][/br]Surface images in atomic-force microscopes are obtained by means of sample horizontal plane scanning with edge curve radius of 2-20 nanometers and probe fixed on the sensing console. Control system monitors probe position relative to the sample surface at each measuring point and keeps the probe-sample distance as specified. Vertical probe position variations at each measuring point form an atomic-force microscopy (AFM) data matrix incorporating a surface profile and a surface properties map. The AFM data matrix is written into a file and is further used for processing, visualization and analysis of measurement results.

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Technology Type
 Design

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Technology Benefits
NT-206 allows the following research modes:[br][/br]* Contact static AFM (surface, pressing and lateral forces display)[br][/br]* Lateral force microscopy (in contact static AFM mode)[br][/br]* Non-contact dynamic AFM[br][/br]* Half-contact dynamic AFMСМ (identical to Tapping Mode®, surface texture, phase displacement, AFM-probe oscillation amplitude display)[br][/br]* Phase contrast microscopy (in mixed dynamic AFM mode)[br][/br]* Two-wire mode (for static and dynamic AFM)[br][/br]* Two-wire variable ascend mode (for static and dynamic AFM)[br][/br]* Multi-cycle area scanning (for static and dynamic AFM)[br][/br]* Magnetic force microscopy (two-wire method)[br][/br]* Current mode[br][/br]* Static force spectroscopy (with calculations for sample quantitative properties, surface energy and elasticity modulus at the analysis point)[br][/br]* Dynamic amplitude-frequency force spectroscopy[br][/br]* Line nano indentation, nano scratching and nano wear-out[br][/br]* Force nanolithography[br][/br]* Temperature dependant measurements (for all of the above modes)[br][/br][br][/br]Economic efficiency of the complex is proved by the fact that the proposed complex can rival more sophisticated and expensive analytical instrumentation manufactures in the west as it provides proper analytical precision and repeatability whereas its price is lower and it requires no high qualification for its originators. Consistent demand observed among researchers, material and nanotechnology developers for a precise express-analysis of thin-film objects and biological cells to allow improving the quality and competitiveness of production ensures a significant number of consumers who could be interested in buying the instrumentation and measurement method.

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Development Stage
 Currently in use/production

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Intellectual Property Rights
 Secret Know-How

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Range of Applications
Solid state physics, microelectronics, theory of light, thin-film technologies, nanotechnologies, semiconductor technologies, superhard materials, glass and related technologies, micro- and nanotribology, surface refinement, polymer and polymer-based composites, high-precision mechanics systems, magnetic recording, vacuum engineering, nano structure visualization, biological objects analysis (for membranes, cells, and etc).

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Classifier Used at the Enterprise Europe Network
 Nano- and Microtechnologies

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Preferable Regions
 North America
 South America
 Europe
 Asia
 Africa
 Australia

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Type of Collaboration Sought
 R&D Contract
 Joint Venture
 For Sale

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Available Technical Assistance
 Documentation
 Personnel

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